Domain evolution in epitaxial ferroelectric thin films.

Authors
강영민LEE KYEONG SEOK백성기
Citation
Proceedings of the 2nd DIM-CISEM Joint Seminar, Seoul, Korea., pp.17 - 35.
Keywords
domain evolution; PLZT; high temperature X-ray diffraction
URI
https://pubs.kist.re.kr/handle/201004/111261
Appears in Collections:
KIST Conference Paper > Others
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