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dc.contributor.author이상조-
dc.contributor.authorJu Byeong Kwon-
dc.contributor.authorOH MYUNG HWAN-
dc.contributor.author박종원-
dc.contributor.author박공석-
dc.contributor.authorLEE KYUNG SANG-
dc.contributor.author김원현-
dc.contributor.author윤광호-
dc.contributor.author전동렬-
dc.date.accessioned2024-01-13T21:01:36Z-
dc.date.available2024-01-13T21:01:36Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/111313-
dc.languageEnglish-
dc.subjectcold cathode-
dc.subjectFEA-
dc.subjectaging test-
dc.titleDegradation characteristics of Si-tip field emission device-
dc.title.alternative실리콘 팁 전계 방출 소자의 가속 열화 시험-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitation제 1 회 한국 정보디스플레이 학술대회 논문집 , KIST, pp.143 - 144-
dc.citation.title제 1 회 한국 정보디스플레이 학술대회 논문집 , KIST-
dc.citation.startPage143-
dc.citation.endPage144-
dc.citation.conferencePlaceKO-
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