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Degradation characteristics of Si-tip field emission device

Other Titles

실리콘 팁 전계 방출 소자의 가속 열화 시험

Authors

이상조; Ju Byeong Kwon; OH MYUNG HWAN; 박종원; 박공석; LEE KYUNG SANG; 김원현; 윤광호; 전동렬

Citation

제 1 회 한국 정보디스플레이 학술대회 논문집 , KIST, pp.143 - 144

Keywords

cold cathode; FEA; aging test

URI

https://pubs.kist.re.kr/handle/201004/111313

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KIST Conference Paper > Others

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