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dc.contributor.author강영민-
dc.contributor.authorLEE KYEONG SEOK-
dc.contributor.author백성기-
dc.date.accessioned2024-01-13T21:04:08Z-
dc.date.available2024-01-13T21:04:08Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/111464-
dc.languageEnglish-
dc.subjectdomain structure-
dc.subjectPLT-
dc.subjectsynchrotron X-ray diffraction-
dc.titleStructural analysis of epitaxial (Pb,La)TiO3 thin films using synchrotron X-ray diffraction-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitationProc. of 13th Korea-Japan Seminar on New Ceramics, Pohang, Korea, Nov. 20-22, 1996., pp.397 - 401-
dc.citation.titleProc. of 13th Korea-Japan Seminar on New Ceramics, Pohang, Korea, Nov. 20-22, 1996.-
dc.citation.startPage397-
dc.citation.endPage401-
dc.citation.conferencePlaceKO-
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