Structural analysis of epitaxial (Pb,La)TiO3 thin films using synchrotron X-ray diffraction

Authors
강영민LEE KYEONG SEOK백성기
Citation
Proc. of 13th Korea-Japan Seminar on New Ceramics, Pohang, Korea, Nov. 20-22, 1996., pp.397 - 401
Keywords
domain structure; PLT; synchrotron X-ray diffraction
URI
https://pubs.kist.re.kr/handle/201004/111464
Appears in Collections:
KIST Conference Paper > Others
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