Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 임동섭 | - |
| dc.contributor.author | Byun Dongjin | - |
| dc.contributor.author | Kim Gyeung Ho | - |
| dc.contributor.author | Nam Ok-Hyun | - |
| dc.contributor.author | 최인훈 | - |
| dc.contributor.author | Park Dal keun | - |
| dc.contributor.author | Kum Dong Wha | - |
| dc.date.accessioned | 2024-01-13T21:04:19Z | - |
| dc.date.available | 2024-01-13T21:04:19Z | - |
| dc.date.created | 2021-09-29 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/111476 | - |
| dc.language | English | - |
| dc.subject | GaN | - |
| dc.title | Atomic force microscopy study of GaN-buffer layers on SiC(0001) by MOCVD | - |
| dc.type | Conference | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.bibliographicCitation | Materials research society symposium proceedings,, v.v. 423, pp.451 - 456 | - |
| dc.citation.title | Materials research society symposium proceedings, | - |
| dc.citation.volume | v. 423 | - |
| dc.citation.startPage | 451 | - |
| dc.citation.endPage | 456 | - |
| dc.citation.conferencePlace | US | - |
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