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Van der-pauw Hall analysis of heavily carbon-doped InGaAs by rapid thermal annealing.

Authors

SON CHANG-SIK; MIN BYUNG DON; KIM MOO SUNG; KIM YOUN; Kim Seong Il; Min Suk-Ki

Citation

Proceedings of the 3rd Korean conference on semiconductors, pp.81 - 82

Keywords

RTA

URI

https://pubs.kist.re.kr/handle/201004/111547

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KIST Conference Paper > Others

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