KIST Library Institutional Repository

Dielectric cap disordering of InGaAs/InP quantum well by PECVD grown SiN and SiO2.

Authors

KANG KWANG NHAM; KIM HWE JONG; W. J. Choi; Lee Seok; D. Woo; Han Il Ki; S. K. Kim; S. H. Kim; Lee Jung Il

Citation

ISIST '96(International symposium on information science and technology), pp.61 - 63

Keywords

양자우물 무질서화

URI

https://pubs.kist.re.kr/handle/201004/111680

Appears in Collections:

KIST Conference Paper > Others

Files in This Item:

There are no files associated with this item.

Export

RIS (EndNote)

XLS (Excel)

XML