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dc.contributor.authorByun Dongjin-
dc.contributor.authorKum Dong Wha-
dc.contributor.authorKim Gyeung Ho-
dc.contributor.authorPark Dal keun-
dc.contributor.author임동섭-
dc.contributor.author최인훈-
dc.date.accessioned2024-01-13T21:33:06Z-
dc.date.available2024-01-13T21:33:06Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/111687-
dc.languageEnglish-
dc.subjectGaN-
dc.titleDefects in GaN films on SiC(0001) with GaN buffer layers by MOCVD.-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationProceedings of the international symposium on blue laser and light emitting diodes, Chiba University, pp.379 - 382-
dc.citation.titleProceedings of the international symposium on blue laser and light emitting diodes, Chiba University-
dc.citation.startPage379-
dc.citation.endPage382-
dc.citation.conferencePlaceJA-
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