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Defects in GaN films on SiC(0001) with GaN buffer layers by MOCVD.

Authors

Byun Dongjin; Kum Dong Wha; Kim Gyeung Ho; Park Dal keun; 임동섭; 최인훈

Citation

Proceedings of the international symposium on blue laser and light emitting diodes, Chiba University, pp.379 - 382

Keywords

GaN

URI

https://pubs.kist.re.kr/handle/201004/111687

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KIST Conference Paper > Others

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