DSpace at KIST: Characterization of solid surfaces using time-of-flight secondary ion mass spectrometry.

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DC Field	Value	Language
dc.contributor.author	LEE YEON HEE	-
dc.contributor.author	HAN SEUNG HEE	-
dc.contributor.author	Lee junghye	-
dc.contributor.author	윤정현	-
dc.date.accessioned	2024-01-13T21:33:17Z	-
dc.date.available	2024-01-13T21:33:17Z	-
dc.date.created	2021-09-29	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/111698	-
dc.language	English	-
dc.subject	TOF-SIMS	-
dc.subject	Plasma ion implantation	-
dc.subject	Multilayer	-
dc.title	Characterization of solid surfaces using time-of-flight secondary ion mass spectrometry.	-
dc.type	Conference	-
dc.description.journalClass	1	-
dc.identifier.bibliographicCitation	Fifth Eurasia Conference on Chemical Sciences, pp.31	-
dc.citation.title	Fifth Eurasia Conference on Chemical Sciences	-
dc.citation.startPage	31	-
dc.citation.endPage	31	-
dc.citation.conferencePlace	CC	-

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