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Fabrication and dc characterization of submicron gate GaAs MESFET.

Authors

KANG KWANG NHAM

Citation

Proc. Korean electronics eng., v.v. 9, no.no. 2, pp.145 - ?

Keywords

GaAs; MESFET

URI

https://pubs.kist.re.kr/handle/201004/112826

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KIST Conference Paper > Others

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