Layer-Controlled Perovskite 2D Nanosheet Interlayer for the Energy Storage Performance of Nanocomposites
- Authors
- Ryu, Ahrom; Yim, Haena; Yoo, Soyeon; Park, Jiseul; Lee, Dong-Gyu; Lee, Jun Young; Song, Hyun-Cheol; Baek, Seung Hyub; Nahm, Sahn; Choi, Ji-Won
- Issue Date
- 2023-07
- Publisher
- Wiley - V C H Verlag GmbbH & Co.
- Citation
- Small, v.19, no.28
- Abstract
- Polymer-based nanocomposites are desirable materials for next-generation dielectric capacitors. 2D dielectric nanosheets have received significant attention as a filler. However, randomly spreading the 2D filler causes residual stresses and agglomerated defect sites in the polymer matrix, which leads to the growth of an electric tree, resulting in a more premature breakdown than expected. Therefore, realizing a well-aligned 2D nanosheet layer with a small amount is a key challenge; it can inhibit the growth of conduction paths without degrading the performance of the material. Here, an ultrathin Sr1.8Bi0.2Nb3O10 (SBNO) nanosheet filler is added as a layer into poly(vinylidene fluoride) (PVDF) films via the Langmuir-Blodgett method. The structural properties, breakdown strength, and energy storage capacity of a PVDF and multilayer PVDF/SBNO/PVDF composites as a function of the thickness-controlled SBNO layer are examined. The seven-layered (only 14 nm) SBNO nanosheets thin film can sufficiently prevent the electrical path in the PVDF/SBNO/PVDF composite and shows a high energy density of 12.8 J cm(-3) at 508 MV m(-1), which is significantly higher than that of the bare PVDF film (9.2 J cm(-3) at 439 MV m(-1)). At present, this composite has the highest energy density among the polymer-based nanocomposites under the filler of thin thickness.
- Keywords
- HIGH-DIELECTRIC-CONSTANT; FERROELECTRIC POLYMERS; BREAKDOWN; DENSITY; FILMS; NANOPARTICLES; CRYSTALLINE; PHASES; 2D nanosheets; dielectric materials; Langmuir-Blodgett (LB) method; nanocomposites; polymers
- ISSN
- 1613-6810
- URI
- https://pubs.kist.re.kr/handle/201004/113566
- DOI
- 10.1002/smll.202300526
- Appears in Collections:
- KIST Article > 2023
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