Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Choi, Kyung Hwan | - |
dc.contributor.author | Cho, Sooheon | - |
dc.contributor.author | Jeong, Byung Joo | - |
dc.contributor.author | Lee, Bom | - |
dc.contributor.author | Jeon, Jiho | - |
dc.contributor.author | Kang, Jinsu | - |
dc.contributor.author | Zhang, Xiaojie | - |
dc.contributor.author | Oh, Hyung-Suk | - |
dc.contributor.author | Lee, Jae-Hyun | - |
dc.contributor.author | Yu, Hak Ki | - |
dc.contributor.author | Choi, Jae-Young | - |
dc.date.accessioned | 2024-01-19T10:33:34Z | - |
dc.date.available | 2024-01-19T10:33:34Z | - |
dc.date.created | 2022-10-13 | - |
dc.date.issued | 2022-12 | - |
dc.identifier.issn | 0925-8388 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/114261 | - |
dc.description.abstract | We experimentally demonstrate for the first time that the bulk InSeI crystals can be effectively delaminated by micromechanical exfoliation into a few nanometer-scale InSeI nanowires, due to the presence of weak van der Waals (vdWs) interaction within the crystal lattice. The exfoliated InSeI nanowires show one-dimensional (1D) bundle structure, and the work function of InSeI measured by Scanning Kelvin probe microscopy shows strong dependency on its thickness. The InSeI has a large bandgap corresponding to 2.12 eV, and when applied to a UV-detecting device, it was confirmed that the device with excellent sen-sitivity can be obtained, because there is little interference in the infrared and visible light regions. Based on these results, InSeI could be a excellent candidate as an additional 1D vdWs material for optoelectronics, including photodetectors or photovoltaic devices.(c) 2022 Elsevier B.V. All rights reserved. | - |
dc.language | English | - |
dc.publisher | Elsevier BV | - |
dc.title | One-dimensional van der Waals material InSeI with large band-gap for optoelectronic applications | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.jallcom.2022.166995 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | Journal of Alloys and Compounds, v.927 | - |
dc.citation.title | Journal of Alloys and Compounds | - |
dc.citation.volume | 927 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000861939900003 | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Physical | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Metallurgy & Metallurgical Engineering | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Metallurgy & Metallurgical Engineering | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | MOS2 | - |
dc.subject.keywordPlus | TRANSITION | - |
dc.subject.keywordPlus | GROWTH | - |
dc.subject.keywordAuthor | One-dimensional van der Waals | - |
dc.subject.keywordAuthor | Nanowires | - |
dc.subject.keywordAuthor | Optical property | - |
dc.subject.keywordAuthor | Scanning Kelvin probe microscopy | - |
dc.subject.keywordAuthor | UV -detectors | - |
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