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dc.contributor.authorChoi, Kyung Hwan-
dc.contributor.authorCho, Sooheon-
dc.contributor.authorJeong, Byung Joo-
dc.contributor.authorLee, Bom-
dc.contributor.authorJeon, Jiho-
dc.contributor.authorKang, Jinsu-
dc.contributor.authorZhang, Xiaojie-
dc.contributor.authorOh, Hyung-Suk-
dc.contributor.authorLee, Jae-Hyun-
dc.contributor.authorYu, Hak Ki-
dc.contributor.authorChoi, Jae-Young-
dc.date.accessioned2024-01-19T10:33:34Z-
dc.date.available2024-01-19T10:33:34Z-
dc.date.created2022-10-13-
dc.date.issued2022-12-
dc.identifier.issn0925-8388-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/114261-
dc.description.abstractWe experimentally demonstrate for the first time that the bulk InSeI crystals can be effectively delaminated by micromechanical exfoliation into a few nanometer-scale InSeI nanowires, due to the presence of weak van der Waals (vdWs) interaction within the crystal lattice. The exfoliated InSeI nanowires show one-dimensional (1D) bundle structure, and the work function of InSeI measured by Scanning Kelvin probe microscopy shows strong dependency on its thickness. The InSeI has a large bandgap corresponding to 2.12 eV, and when applied to a UV-detecting device, it was confirmed that the device with excellent sen-sitivity can be obtained, because there is little interference in the infrared and visible light regions. Based on these results, InSeI could be a excellent candidate as an additional 1D vdWs material for optoelectronics, including photodetectors or photovoltaic devices.(c) 2022 Elsevier B.V. All rights reserved.-
dc.languageEnglish-
dc.publisherElsevier BV-
dc.titleOne-dimensional van der Waals material InSeI with large band-gap for optoelectronic applications-
dc.typeArticle-
dc.identifier.doi10.1016/j.jallcom.2022.166995-
dc.description.journalClass1-
dc.identifier.bibliographicCitationJournal of Alloys and Compounds, v.927-
dc.citation.titleJournal of Alloys and Compounds-
dc.citation.volume927-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000861939900003-
dc.relation.journalWebOfScienceCategoryChemistry, Physical-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryMetallurgy & Metallurgical Engineering-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaMetallurgy & Metallurgical Engineering-
dc.type.docTypeArticle-
dc.subject.keywordPlusMOS2-
dc.subject.keywordPlusTRANSITION-
dc.subject.keywordPlusGROWTH-
dc.subject.keywordAuthorOne-dimensional van der Waals-
dc.subject.keywordAuthorNanowires-
dc.subject.keywordAuthorOptical property-
dc.subject.keywordAuthorScanning Kelvin probe microscopy-
dc.subject.keywordAuthorUV -detectors-
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KIST Article > 2022
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