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dc.contributor.authorKim, Yosep-
dc.contributor.authorKim, Yong-Su-
dc.contributor.authorLee, Sang-Yun-
dc.contributor.authorCho, Young-Wook-
dc.contributor.authorMoon, Sung-
dc.contributor.authorKim, Yoon-Ho-
dc.contributor.authorHan, Sang-Wook-
dc.date.accessioned2024-01-19T10:39:05Z-
dc.date.available2024-01-19T10:39:05Z-
dc.date.created2022-02-28-
dc.date.issued2018-05-
dc.identifier.issn2160-9020-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/114369-
dc.description.abstractWe demonstrate measurement of the sequential weak value of two incompatible observables by making use of two-photon quantum interference. We also demonstrate direct quantum process tomography of a qubit channel using the sequential weak value.-
dc.languageEnglish-
dc.publisherIEEE-
dc.titleDirect quantum process tomography via measuring sequential weak values-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationConference on Lasers and Electro-Optics (CLEO)-
dc.citation.titleConference on Lasers and Electro-Optics (CLEO)-
dc.citation.conferencePlaceUS-
dc.citation.conferencePlaceSan Jose, CA-
dc.citation.conferenceDate2018-05-13-
dc.relation.isPartOf2018 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO)-
dc.identifier.wosid000526031000167-
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KIST Conference Paper > 2018
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