Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Yosep | - |
dc.contributor.author | Kim, Yong-Su | - |
dc.contributor.author | Lee, Sang-Yun | - |
dc.contributor.author | Cho, Young-Wook | - |
dc.contributor.author | Moon, Sung | - |
dc.contributor.author | Kim, Yoon-Ho | - |
dc.contributor.author | Han, Sang-Wook | - |
dc.date.accessioned | 2024-01-19T10:39:05Z | - |
dc.date.available | 2024-01-19T10:39:05Z | - |
dc.date.created | 2022-02-28 | - |
dc.date.issued | 2018-05 | - |
dc.identifier.issn | 2160-9020 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/114369 | - |
dc.description.abstract | We demonstrate measurement of the sequential weak value of two incompatible observables by making use of two-photon quantum interference. We also demonstrate direct quantum process tomography of a qubit channel using the sequential weak value. | - |
dc.language | English | - |
dc.publisher | IEEE | - |
dc.title | Direct quantum process tomography via measuring sequential weak values | - |
dc.type | Conference | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | Conference on Lasers and Electro-Optics (CLEO) | - |
dc.citation.title | Conference on Lasers and Electro-Optics (CLEO) | - |
dc.citation.conferencePlace | US | - |
dc.citation.conferencePlace | San Jose, CA | - |
dc.citation.conferenceDate | 2018-05-13 | - |
dc.relation.isPartOf | 2018 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | - |
dc.identifier.wosid | 000526031000167 | - |
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