Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Shin, Hyogeun | - |
dc.contributor.author | Choi, Woongsun | - |
dc.contributor.author | Yoon, Gun-Wook | - |
dc.contributor.author | Cho, Il-Joo | - |
dc.contributor.author | Choi, Nakwon | - |
dc.contributor.author | Yoon, Jun-Bo | - |
dc.contributor.author | Seo, Su Yeong | - |
dc.date.accessioned | 2024-01-19T10:39:50Z | - |
dc.date.available | 2024-01-19T10:39:50Z | - |
dc.date.created | 2022-02-28 | - |
dc.date.issued | 2018-01 | - |
dc.identifier.issn | 1084-6999 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/114396 | - |
dc.description.abstract | This paper reports on a high-resolution lensless fluorescence imaging system using membrane deflection for reducing the gap between fluorescent samples and a CMOS image sensor array. The presented system applied the principle of the total internal reflection of excitation light inside a PDMS chip to minimize the exposure of excitation light to the image sensor. We integrated a very thin (5.5 mu m) PDMS membrane as a flexible deflector, which allowed for significant reduction of the gap (-20 mu m) inevitably created during the conventional packaging (i.e., wire bonding) of image sensors. In the fabricated system, we achieved minimum distance of 7.5 mu m between fluorescent samples and an image sensor array. This reduced gap almost directly corresponds to a resolution as high as 7.5 mu m, based on the point spread function (PSF). | - |
dc.language | English | - |
dc.publisher | IEEE | - |
dc.title | A HIGH-RESOLUTION LENSLESS FLUORESCENCE IMAGING SYSTEM USING MEMBRANE DEFLECTION FOR REDUCING GAP BETWEEN SAMPLES AND IMAGE SENSOR | - |
dc.type | Conference | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | 31st IEEE International Conference on Micro Electro Mechanical Systems (MEMS), pp.419 - 421 | - |
dc.citation.title | 31st IEEE International Conference on Micro Electro Mechanical Systems (MEMS) | - |
dc.citation.startPage | 419 | - |
dc.citation.endPage | 421 | - |
dc.citation.conferencePlace | US | - |
dc.citation.conferencePlace | Belfast, NORTH IRELAND | - |
dc.citation.conferenceDate | 2018-01-21 | - |
dc.relation.isPartOf | 2018 IEEE MICRO ELECTRO MECHANICAL SYSTEMS (MEMS) | - |
dc.identifier.wosid | 000434960900112 | - |
dc.identifier.scopusid | 2-s2.0-85047005430 | - |
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