In Situ Scanning Electron Microscopy Analysis of the Interfacial Failure of Oxide Scales on Stainless Steels and Its Effect on Sticking during Hot Rolling

Authors
Lee, SoyeonKim, Seung-RokTriambulo, Ross E.Lim, Chang-JinKim, Han-JinSuh, Jin-YooKang, Hyung-GuPark, Jin-Woo
Issue Date
2022-05
Publisher
ACS Publications
Citation
ACS OMEGA, v.7, no.17, pp.15174 - 15185
Abstract
Despite various strategies to address sticking failure in stainless steels (STSs), difficulties in understanding its fundamental mechanisms hinder precise solutions during STS fabrication. This study investigated the effect of chromium (Cr) content on the microstructures and failure modes of oxide scales under a tensile load, simulating the hot-rolling process. The dynamic, real-time behavior of crack initiation, propagation, and interfacial delamination in the oxide scales under tension was analyzed using an in situ scanning electron microscopy (SEM) tensile test. With a high Cr content, iron (Fe) oxide and chromium(III) oxide (Cr2O3) form a layered structure, which is delaminated along the interfaces between the thin Cr2O3 layer and the bulk after perpendicular cracking. The saturated crack densities obtained from in situ SEM provide interfacial strength, while the elastic modulus and hardness obtained from nanoindentation provide vertical fracture strength. In combination with an ex situ elemental image analysis, the in situ SEM results reveal three different failure modes of the four different STSs. The results confirm that sticking failure is more likely to occur as the Cr content increases.
Keywords
MECHANICAL-PROPERTIES; OXIDATION; MICROSTRUCTURE; DEFORMATION; INITIATION; FRICTION; BEHAVIOR
ISSN
2470-1343
URI
https://pubs.kist.re.kr/handle/201004/115186
DOI
10.1021/acsomega.2c01267
Appears in Collections:
KIST Article > 2022
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE