DSpace at KISTKIST Article2021

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dc.contributor.authorChoi, J.W.-
dc.contributor.authorSeo, J.H.-
dc.contributor.authorHwang, C.-
dc.contributor.authorCho, B.I.-
dc.contributor.authorLee, D.R.-
dc.contributor.authorChang, Y.J.-
dc.date.accessioned2024-01-19T13:33:29Z-
dc.date.available2024-01-19T13:33:29Z-
dc.date.created2022-01-10-
dc.date.issued2021-10-
dc.identifier.issn1567-1739-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/116305-
dc.description.abstract[No abstract available]-
dc.languageEnglish-
dc.publisherElsevier B.V.-
dc.titleAdvanced materials characterization using synchrotron radiation-
dc.typeArticle-
dc.identifier.doi10.1016/j.cap.2021.07.005-
dc.description.journalClass1-
dc.identifier.bibliographicCitationCurrent Applied Physics, v.30, pp.1 - 3-
dc.citation.titleCurrent Applied Physics-
dc.citation.volume30-
dc.citation.startPage1-
dc.citation.endPage3-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.identifier.wosid000735613300001-
dc.identifier.scopusid2-s2.0-85110463625-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeEditorial Material-
dc.subject.keywordAuthorAngle-resolved photoemission spectroscopy (ARPES)-
dc.subject.keywordAuthorSynchrotron light sources-
dc.subject.keywordAuthorX-ray absorption spectroscopy (XAS)-
dc.subject.keywordAuthorX-ray diffraction (XRD)-
dc.subject.keywordAuthorX-ray magnetic circular dichroism (XMCD)-
dc.subject.keywordAuthorX-ray photoelectron spectroscopy (XPS)-
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