Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Son, Myungwoo | - |
dc.contributor.author | Jang, Jaewon | - |
dc.contributor.author | Kim, Gi-Hwan | - |
dc.contributor.author | Lee, Ji-Hwan | - |
dc.contributor.author | Chun, Dong Won | - |
dc.contributor.author | Bae, Jee Hwan | - |
dc.contributor.author | Kim, In S. | - |
dc.contributor.author | Ham, Moon-Ho | - |
dc.contributor.author | Chee, Sang-Soo | - |
dc.date.accessioned | 2024-01-19T14:31:18Z | - |
dc.date.available | 2024-01-19T14:31:18Z | - |
dc.date.created | 2021-10-21 | - |
dc.date.issued | 2021-06 | - |
dc.identifier.issn | 2637-6113 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/116846 | - |
dc.description.abstract | Herein, we introduced surface modification of a Cu catalyst by employing CH4 pre-annealing, which changed the uniformly rough Cu surface; this resulted in formation of high-quality and uniform Bernal-stacked bilayer graphene as well as monolayer graphene due to controlled synthesis time. A well-designed Cu surface was developed for synthesis of bilayer graphene with high coverage (>95%) and a high Bernal-stacking ratio (similar to 99%). Dual-gated transistors of Bernal-stacked bilayer graphene showed typical tunable transfer characteristics under varying gate voltages with carrier mobilities of 1000-2000 cm(2) V-1 s(-1). Through density functional theory calculations, we demonstrated that a uniformly rough Cu surface is favorable for synthesis of Bernal-stacked bilayer graphene. Finally, we employed bilayer graphene as a perfect diffusion barrier facilitated by complementing the diffusion pathway of numerous grain boundaries in graphene. | - |
dc.language | English | - |
dc.publisher | AMER CHEMICAL SOC | - |
dc.title | Large-Area Bernal-Stacked Bilayer Graphene Film on a Uniformly Rough Cu Surface via Chemical Vapor Deposition | - |
dc.type | Article | - |
dc.identifier.doi | 10.1021/acsaelm.0c00905 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | ACS APPLIED ELECTRONIC MATERIALS, v.3, no.6, pp.2497 - 2503 | - |
dc.citation.title | ACS APPLIED ELECTRONIC MATERIALS | - |
dc.citation.volume | 3 | - |
dc.citation.number | 6 | - |
dc.citation.startPage | 2497 | - |
dc.citation.endPage | 2503 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000665655800007 | - |
dc.identifier.scopusid | 2-s2.0-85106663759 | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | TOTAL-ENERGY CALCULATIONS | - |
dc.subject.keywordPlus | HIGH-QUALITY | - |
dc.subject.keywordPlus | NI ALLOY | - |
dc.subject.keywordPlus | GROWTH | - |
dc.subject.keywordPlus | EQUILIBRIUM | - |
dc.subject.keywordPlus | PENETRATION | - |
dc.subject.keywordPlus | DIFFUSION | - |
dc.subject.keywordPlus | BANDGAP | - |
dc.subject.keywordPlus | OXYGEN | - |
dc.subject.keywordAuthor | bilayer graphene | - |
dc.subject.keywordAuthor | Bernal-stacking | - |
dc.subject.keywordAuthor | bandgap | - |
dc.subject.keywordAuthor | CH4 pre-annealing | - |
dc.subject.keywordAuthor | uniformly rough Cu surface | - |
dc.subject.keywordAuthor | diffusion barrier | - |
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