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dc.contributor.authorZhai, Min-
dc.contributor.authorLocquet, A.-
dc.contributor.authorJung, Mi-
dc.contributor.authorWoo, Deokha-
dc.contributor.authorCitrin, D. S.-
dc.date.accessioned2024-01-19T17:03:47Z-
dc.date.available2024-01-19T17:03:47Z-
dc.date.created2022-01-25-
dc.date.issued2020-07-
dc.identifier.issn0146-9592-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/118416-
dc.description.abstractTerahertz birefringence in nanoporous Al2O3 films grown on Al substrates is characterized nondestructively by polarization-resolved terahertz spectroscopy. Sparse deconvolution is used to find the film thicknesses from the data, showing good agreement with the values measured directly by destructive cross-sectional field-emission scanning electron microscopy. (C) 2020 Optical Society of America-
dc.languageEnglish-
dc.publisherOPTICAL SOC AMER-
dc.titleCharacterization of nanoporous Al2O3 films at terahertz frequencies-
dc.typeArticle-
dc.identifier.doi10.1364/OL.390129-
dc.description.journalClass1-
dc.identifier.bibliographicCitationOPTICS LETTERS, v.45, no.14, pp.4092 - 4095-
dc.citation.titleOPTICS LETTERS-
dc.citation.volume45-
dc.citation.number14-
dc.citation.startPage4092-
dc.citation.endPage4095-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000553826600068-
dc.identifier.scopusid2-s2.0-85088254644-
dc.relation.journalWebOfScienceCategoryOptics-
dc.relation.journalResearchAreaOptics-
dc.type.docTypeArticle-
dc.subject.keywordPlusBIREFRINGENCE-
dc.subject.keywordPlusALUMINUM-
dc.subject.keywordPlusARRAYS-
dc.subject.keywordPlusANODIZATION-
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