Full metadata record

DC Field Value Language
dc.contributor.authorJu, BK-
dc.contributor.authorPark, HW-
dc.contributor.authorLee, YH-
dc.contributor.authorChung, IJ-
dc.contributor.authorHaskard, MR-
dc.contributor.authorPark, JH-
dc.contributor.authorOh, MH-
dc.date.accessioned2024-01-19T18:08:02Z-
dc.date.available2024-01-19T18:08:02Z-
dc.date.created2022-03-07-
dc.date.issued1996-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/119048-
dc.description.abstractUniform and reproducible silicon tip arrays were fabricated using the reactive ion etching followed by the re-oxidation sharpening. Molybdenum was coated on the some of the silicon tip array. Current-voltage characteristics and current fluctuations were tested in the high vacuum level. Turn-on voltage of the uncoated tip was 35V and maximum current was 1mA, while turn-on voltage of the coated tip was 15V and maximum current was 6mA. While uncoated silicon tip was destroyed after 13 minutes after operation and characteristics. Obtained currents were proved to be field emission currents using the Fowler-Nordheim plot studies.-
dc.languageEnglish-
dc.publisherI E E E-
dc.titleField emission properties of Mo-coated Si field emitter arrays and formation of molybdenum silicide-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitation9th International Vacuum Microelectronics Conference(IVMC'96), pp.221 - 225-
dc.citation.title9th International Vacuum Microelectronics Conference(IVMC'96)-
dc.citation.startPage221-
dc.citation.endPage225-
dc.citation.conferencePlaceUS-
dc.citation.conferencePlaceST PETERSBURG, RUSSIA-
dc.citation.conferenceDate1996-07-07-
dc.relation.isPartOfIVMC '96 - 9TH INTERNATIONAL VACUUM MICROELECTRONICS CONFERENCE, TECHNICAL DIGEST-
dc.identifier.wosidA1996BJ05U00052-
dc.identifier.scopusid2-s2.0-0030349544-
dc.type.docTypeProceedings Paper-
Appears in Collections:
KIST Conference Paper > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE