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dc.contributor.authorBae, Jee Hwan-
dc.contributor.authorKim, Tae Kyoung-
dc.contributor.authorKim, Hyeon Min-
dc.contributor.authorHong, Jae-Young-
dc.contributor.authorKim, Ji-Young-
dc.contributor.authorCho, Min Kyung-
dc.contributor.authorKim, Gyeung Ho-
dc.contributor.authorHa, Heon-Young-
dc.contributor.authorChun, Dong Won-
dc.date.accessioned2024-01-19T19:32:14Z-
dc.date.available2024-01-19T19:32:14Z-
dc.date.created2021-09-02-
dc.date.issued2019-08-
dc.identifier.issn0018-9464-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/119716-
dc.description.abstractThe effect of the thicknesses of the Pt intermediate layer and FePt magnetic layer in CrV/ Pt/ FePt multilayers on the microstructure and magnetic properties for the perpendicular magnetic anisotropy was investigated. The Pt (0-4 nm) and FePt (7-28 nm) layers were deposited on a 90 nm-thick Cr94V6 underlayer at 350 degrees C, and the crystal structure and magnetic properties of the fabricated CrV/ Pt/ FePt multilayers were characterized. X-ray diffraction and vibrating sample magnetometer measurements revealed that the out-of-plane coercivity (Hc-out) and squareness increase when the Pt intermediate layer is deposited between CrV and FePt because it protects against diffusion of Cr and V atoms into the FePt magnetic layer during deposition. In addition, we confirmed that Hc-out and squareness decrease with increasing FePt layer thickness in the range of 7-28 nm. As a result, the maximum Hc-out, S, and squareness were obtained for a multilayer with a CrV thickness of 90 nm, Pt thickness of 2 nm, and FePt thickness of 7 nm. This paper shows that highly ordered FePt L1(0) (001) can be fabricated by sublayer thickness control.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleEffect of Pt and FePt Layer Thickness on Microstructure and Magnetic Properties of L1(0) FePt Films With Perpendicular Anisotropy-
dc.typeArticle-
dc.identifier.doi10.1109/TMAG.2019.2908134-
dc.description.journalClass1-
dc.identifier.bibliographicCitationIEEE TRANSACTIONS ON MAGNETICS, v.55, no.8-
dc.citation.titleIEEE TRANSACTIONS ON MAGNETICS-
dc.citation.volume55-
dc.citation.number8-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000476800100001-
dc.identifier.scopusid2-s2.0-85069784625-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
dc.subject.keywordPlusTHIN-FILMS-
dc.subject.keywordPlusDEPOSITION TEMPERATURE-
dc.subject.keywordPlusNANOPARTICLES-
dc.subject.keywordPlusUNDERLAYER-
dc.subject.keywordPlusMORPHOLOGY-
dc.subject.keywordPlusAG-
dc.subject.keywordAuthorCrV/Pt/FePt multilayer-
dc.subject.keywordAuthorFePt thin film-
dc.subject.keywordAuthorin situ L10 ordering-
dc.subject.keywordAuthorperpendicular magnetic recording media-
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KIST Article > 2019
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