High-Mobility MoS2 Directly Grown on Polymer Substrate with Kinetics-Controlled Metal-Organic Chemical Vapor Deposition
- Authors
- Mun, Jihun; Park, Hyeji; Park, Jaeseo; Joung, DaeHwa; Lee, Seoung-Ki; Leem, Juyoung; Myoung, Jae-Min; Park, Jonghoo; Jeong, Soo-Hwan; Chegal, Won C.; Nam, SungWoo; Kang, Sang-Woo
- Issue Date
- 2019-04
- Publisher
- AMER CHEMICAL SOC
- Citation
- ACS APPLIED ELECTRONIC MATERIALS, v.1, no.4, pp.608 - 616
- Abstract
- Batch growth of high-mobility (mu(FE) > 10 cm(2)V(-1)s(-1)) molybdenum disulfide (MoS2) films can be achieved by means of the chemical vapor deposition (CVD) method at high temperatures (>500 degrees C) on rigid substrates. Although high-temperature growth guarantees film quality, time- and cost-consuming transfer processes are required to fabricate flexible devices. In contrast, low-temperature approaches (<250 degrees C) for direct growth on polymer substrates have thus far achieved film growth with limited spatial homogeneity and electrical performance (mu(FE) is unreported). The growth of a high-mobility MoS2 film directly on a polymer substrate remains challenging. In this study, a novel low-temperature (250 degrees C) process to successfully overcome this challenge by kinetics-controlled metal-organic CVD (MOCVD) is proposed. Low-temperature MOCVD was achieved by maintaining the flux of an alkali-metal catalyst constant during the process; furthermore, MoS2 was directly synthesized on a polyimide (PI) substrate. The as-grown film exhibits a 4 in. wafer-scale uniformity, field-effect mobility of 10 cm(2)V(-1)s(-1), and on/off ratio of 10(5), which are comparable with those of high-temperature-grown MoS2. The directly fabricated flexible MoS2 field-effect transistors demonstrate excellent stability of electrical properties following a 1000 cycle bending test with a 1 mm radius.
- Keywords
- FIELD-EFFECT TRANSISTORS; LARGE-AREA; MONOLAYER MOS2; ATOMIC LAYERS; PHASE GROWTH; ION GEL; FILMS; TRANSITION; EVOLUTION; SIO2; FIELD-EFFECT TRANSISTORS; LARGE-AREA; MONOLAYER MOS2; ATOMIC LAYERS; PHASE GROWTH; ION GEL; FILMS; TRANSITION; EVOLUTION; SIO2; MoS2; kinetics-controlled MOCVD; low-temperature growth; direct growth; flexible FET
- ISSN
- 2637-6113
- URI
- https://pubs.kist.re.kr/handle/201004/120180
- DOI
- 10.1021/acsaelm.9b00078
- Appears in Collections:
- KIST Article > 2019
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