Simulation Perspectives of Sub-1V Single-Supply Z(2)-FET 1T-DRAM Cells for Low-Power

Authors
Navarro, CarlosMarquez, CarlosNavarro, SantiagoLozano, CarmenKwon, SehyunKim, Yong-TaeGamiz, Francisco
Issue Date
2019-02
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Citation
IEEE ACCESS, v.7, pp.40279 - 40284
Abstract
With the upcoming Internet of Things (IoT), low-power devices are becoming mainstream these days. The need for memory elements able to operate at reduced biasing conditions is therefore of utmost importance. In this paper, one of the most promising capacitor-less dynamic RAM cell, the Z(2)-FET (zero subthreshold swings, zero impact ionization field-effect transistor), is analyzed through advanced numerical simulations to study its sub-1V operation capabilities. SiGe compounds and tuned workfunction are selected to further reduce the operating voltage to limit energy consumption. The results demonstrate functional SiGe cells with up to 75% energy reduction with respect to identical Si cells.
Keywords
MECHANISMS; OPERATION; MECHANISMS; OPERATION; 1T-DRAM; capacitor-less; FD-SOI; germanium; memory; low-power; p-i-n diode; single supply; silicon; TCAD; workfunction; Z(2)-FET
ISSN
2169-3536
URI
https://pubs.kist.re.kr/handle/201004/120392
DOI
10.1109/ACCESS.2019.2907151
Appears in Collections:
KIST Article > 2019
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