Ultimate limit in size and performance of WSe2 vertical diodes
- Authors
- Nazir, Ghazanfar; Kim, Hakseong; Kim, Jihwan; Kim, Kyoung Soo; Shin, Dong Hoon; Khan, Muhammad Farooq; Lee, Dong Su; Hwang, Jun Yeon; Hwang, Chanyong; Suh, Junho; Eom, Jonghwa; Jung, Suyong
- Issue Date
- 2018-12
- Publisher
- Nature Publishing Group
- Citation
- Nature Communications, v.9
- Abstract
- Precise doping-profile engineering in van der Waals heterostructures is a key element to promote optimal device performance in various electrical and optical applications with twodimensional layered materials. Here, we report tungsten diselenide-(WSe2) based pure vertical diodes with atomically defined p-, i- and n-channel regions. Externally modulated p-and n-doped layers are respectively formed on the bottom and the top facets of WSe2 single crystals by direct evaporations of high and low work-function metals platinum and gadolinium, thus forming atomically sharp p-i-n heterojunctions in the homogeneous WSe2 layers. As the number of layers increases, charge transport through the vertical WSe2 p-i-n heterojunctions is characterized by a series of quantum tunneling events; direct tunneling, Fowler-Nordheim tunneling, and Schottky emission tunneling. With optimally selected WSe2 thickness, our vertical heterojunctions show superb diode characteristics of an unprecedentedly high current density and low turn-on voltages while maintaining good current rectification.
- Keywords
- LIGHT-EMITTING-DIODES; P-N-JUNCTIONS; LAYERED MATERIALS; BLACK PHOSPHORUS; HETEROSTRUCTURES; TRANSISTORS; 2D materials; Vertical diode; Schottky emission; p-i-n diode; current rectification
- ISSN
- 2041-1723
- URI
- https://pubs.kist.re.kr/handle/201004/120649
- DOI
- 10.1038/s41467-018-07820-8
- Appears in Collections:
- KIST Article > 2018
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