Ultimate limit in size and performance of WSe2 vertical diodes

Authors
Nazir, GhazanfarKim, HakseongKim, JihwanKim, Kyoung SooShin, Dong HoonKhan, Muhammad FarooqLee, Dong SuHwang, Jun YeonHwang, ChanyongSuh, JunhoEom, JonghwaJung, Suyong
Issue Date
2018-12
Publisher
Nature Publishing Group
Citation
Nature Communications, v.9
Abstract
Precise doping-profile engineering in van der Waals heterostructures is a key element to promote optimal device performance in various electrical and optical applications with twodimensional layered materials. Here, we report tungsten diselenide-(WSe2) based pure vertical diodes with atomically defined p-, i- and n-channel regions. Externally modulated p-and n-doped layers are respectively formed on the bottom and the top facets of WSe2 single crystals by direct evaporations of high and low work-function metals platinum and gadolinium, thus forming atomically sharp p-i-n heterojunctions in the homogeneous WSe2 layers. As the number of layers increases, charge transport through the vertical WSe2 p-i-n heterojunctions is characterized by a series of quantum tunneling events; direct tunneling, Fowler-Nordheim tunneling, and Schottky emission tunneling. With optimally selected WSe2 thickness, our vertical heterojunctions show superb diode characteristics of an unprecedentedly high current density and low turn-on voltages while maintaining good current rectification.
Keywords
LIGHT-EMITTING-DIODES; P-N-JUNCTIONS; LAYERED MATERIALS; BLACK PHOSPHORUS; HETEROSTRUCTURES; TRANSISTORS; 2D materials; Vertical diode; Schottky emission; p-i-n diode; current rectification
ISSN
2041-1723
URI
https://pubs.kist.re.kr/handle/201004/120649
DOI
10.1038/s41467-018-07820-8
Appears in Collections:
KIST Article > 2018
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