Challenging endeavor to integrate gallium and carbon via direct bonding to evolve GaN on diamond architecture

Authors
Kim, Jong CheolLee, JinhyungKim, JongsikSingh, Rajiv K.Jawali, PuneetSubhash, GhatuLee, HaigunArjunan, Arul Chakkaravarthi
Issue Date
2018-01-01
Publisher
PERGAMON-ELSEVIER SCIENCE LTD
Citation
SCRIPTA MATERIALIA, v.142, pp.138 - 142
Abstract
This paper depicts efforts for fabricating GaN on diamond microstructure through direct bonding between Ga and C, while excluding the use of adhesive interlayer during spark plasma sintering (SPS) process. The resulting GaN on diamond architecture is seemingly successful, as suggested by macroscopic morphological observations. The microscopic inspection using high-resolution transmission electron microscopy (HRTEM), however, shows a unique, off-the-chart interlayer configuration, wherein the components are migrated, etched, or fused to tentatively form multiple crystal phases. These phases can be constructed based on their utmost stabilities among all possible phases thermodynamically driven under or near the SPS conditions. (C) 2017 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
Keywords
POWER; ELECTRONICS; TRANSISTORS; DEVICE; HEMTS; POWER; ELECTRONICS; TRANSISTORS; DEVICE; HEMTS; GaN on diamond; Spark plasma sintering; Direct bonding; Heat dissipation; Immiscibility between Ga and C
ISSN
1359-6462
URI
https://pubs.kist.re.kr/handle/201004/121828
DOI
10.1016/j.scriptamat.2017.08.041
Appears in Collections:
KIST Article > 2018
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