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dc.contributor.authorLiu, Jin-
dc.contributor.authorDavanco, Marcelo I.-
dc.contributor.authorSapienza, Luca-
dc.contributor.authorKonthasinghe, Kumarasiri-
dc.contributor.authorDe Miranda Cardoso, Jose Vinicius-
dc.contributor.authorSong, Jin Dong-
dc.contributor.authorBadolato, Antonio-
dc.contributor.authorSrinivasan, Kartik-
dc.date.accessioned2024-01-20T02:30:20Z-
dc.date.available2024-01-20T02:30:20Z-
dc.date.created2021-09-01-
dc.date.issued2017-02-
dc.identifier.issn0034-6748-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/123136-
dc.description.abstractWe report a photoluminescence imaging system for locating single quantum emitters with respect to alignment features. Samples are interrogated in a 4 K closed-cycle cryostat by a high numerical aperture (NA= 0.9, 100x magnification) objective that sits within the cryostat, enabling high efficiency collection of emitted photons without image distortions due to the cryostat windows. The locations of single InAs/GaAs quantum dots within a >50 mu m x 50 mu m field of view are determined with approximate to 4.5 nm uncertainty (one standard deviation) in a 1 s long acquisition. The uncertainty is determined through a combination of a maximum likelihood estimate for localizing the quantum dot emission, and a cross correlation method for determining the alignment mark center. This location technique can be an important step in the high-throughput creation of nanophotonic devices that rely upon the interaction of highly confined optical modes with single quantum emitters. Published by AIP Publishing.-
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.subjectELECTRON-BEAM LITHOGRAPHY-
dc.subjectLOCALIZATION ANALYSIS-
dc.subjectDOTS-
dc.subjectPHOTON-
dc.subjectGAAS-
dc.titleCryogenic photoluminescence imaging system for nanoscale positioning of single quantum emitters-
dc.typeArticle-
dc.identifier.doi10.1063/1.4976578-
dc.description.journalClass1-
dc.identifier.bibliographicCitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.88, no.2-
dc.citation.titleREVIEW OF SCIENTIFIC INSTRUMENTS-
dc.citation.volume88-
dc.citation.number2-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000395902700016-
dc.identifier.scopusid2-s2.0-85013895696-
dc.relation.journalWebOfScienceCategoryInstruments & Instrumentation-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalResearchAreaInstruments & Instrumentation-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
dc.subject.keywordPlusELECTRON-BEAM LITHOGRAPHY-
dc.subject.keywordPlusLOCALIZATION ANALYSIS-
dc.subject.keywordPlusDOTS-
dc.subject.keywordPlusPHOTON-
dc.subject.keywordPlusGAAS-
dc.subject.keywordAuthornanoscale positioning-
dc.subject.keywordAuthorsingle quantum dots-
dc.subject.keywordAuthorsingle photon-
dc.subject.keywordAuthorcryogenic photoluminescence-
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KIST Article > 2017
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