Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Ji, Yongsung | - |
dc.contributor.author | Yang, Yang | - |
dc.contributor.author | Lee, Seoung-Ki | - |
dc.contributor.author | Ruan, Gedeng | - |
dc.contributor.author | Kim, Tae-Wook | - |
dc.contributor.author | Fei, Huilong | - |
dc.contributor.author | Lee, Seung-Hoon | - |
dc.contributor.author | Kim, Dong-Yu | - |
dc.contributor.author | Yoon, Jongwon | - |
dc.contributor.author | Tour, James M. | - |
dc.date.accessioned | 2024-01-20T03:34:23Z | - |
dc.date.available | 2024-01-20T03:34:23Z | - |
dc.date.created | 2021-09-04 | - |
dc.date.issued | 2016-08 | - |
dc.identifier.issn | 1936-0851 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/123836 | - |
dc.description.abstract | Flexible resistive random access memory (RRAM) devices have attracted great interest for future nonvolatile memories. However, making active layer films at high temperature can be a hindrance to RRAM device fabrication on flexible substrates. Here, we introduced a flexible nanoporous (NP) WO3-x RRAM device using anodic treatment in a room-temperature process. The flexible NP WO3-x RRAM device showed bipolar switching characteristics and a high I-ON/IOFF ratio of similar to 10(5). The device also showed stable retention time over 5 X 10(5) s, outstanding cell-to-cell uniformity, and bending endurance over 10(3) cycles when maximum bending conditions. | - |
dc.language | English | - |
dc.publisher | AMER CHEMICAL SOC | - |
dc.subject | RESISTANCE SWITCHING CHARACTERISTICS | - |
dc.subject | MEMRISTIVE DEVICES | - |
dc.subject | THIN-FILM | - |
dc.subject | NANOSHEETS | - |
dc.subject | EVOLUTION | - |
dc.subject | RERAM | - |
dc.title | Flexible Nanoporous WO3-x Nonvolatile Memory Device | - |
dc.type | Article | - |
dc.identifier.doi | 10.1021/acsnano.6b02711 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | ACS NANO, v.10, no.8, pp.7598 - 7603 | - |
dc.citation.title | ACS NANO | - |
dc.citation.volume | 10 | - |
dc.citation.number | 8 | - |
dc.citation.startPage | 7598 | - |
dc.citation.endPage | 7603 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000381959100042 | - |
dc.identifier.scopusid | 2-s2.0-84983399558 | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Physical | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | RESISTANCE SWITCHING CHARACTERISTICS | - |
dc.subject.keywordPlus | MEMRISTIVE DEVICES | - |
dc.subject.keywordPlus | THIN-FILM | - |
dc.subject.keywordPlus | NANOSHEETS | - |
dc.subject.keywordPlus | EVOLUTION | - |
dc.subject.keywordPlus | RERAM | - |
dc.subject.keywordAuthor | resistive random access memory | - |
dc.subject.keywordAuthor | flexible memory | - |
dc.subject.keywordAuthor | WO3-x memory | - |
dc.subject.keywordAuthor | nanoporous | - |
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