DSpace at KISTKIST Article2016

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dc.contributor.authorAbbasi, M.-
dc.contributor.authorKim, D.-I.-
dc.contributor.authorGuim, H.-U.-
dc.contributor.authorJung, W.-S.-
dc.date.accessioned2024-01-20T04:01:45Z-
dc.date.available2024-01-20T04:01:45Z-
dc.date.created2021-09-02-
dc.date.issued2016-07-
dc.identifier.issn1431-9276-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/123939-
dc.description.abstract[No abstract available]-
dc.languageEnglish-
dc.publisherCambridge University Press-
dc.titleTransmission-EBSD using high current electron beams-
dc.typeArticle-
dc.identifier.doi10.1017/S1431927616009107-
dc.description.journalClass1-
dc.identifier.bibliographicCitationMicroscopy and Microanalysis, v.22, no.S3, pp.1652 - 1653-
dc.citation.titleMicroscopy and Microanalysis-
dc.citation.volume22-
dc.citation.numberS3-
dc.citation.startPage1652-
dc.citation.endPage1653-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.scopusid2-s2.0-85020015543-
dc.type.docTypeArticle-
dc.subject.keywordAuthorTransmission-EBSD-
dc.subject.keywordAuthorTransmitted Kikuchi Diffraction-
dc.subject.keywordAuthorIon implantation-
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KIST Article > 2016
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