Revisiting Metal Sulfide Semiconductors: A Solution-Based General Protocol for Thin Film Formation, Hall Effect Measurement, and Application Prospects

Authors
Shinde, Dipak V.Patil, Supriya A.Cho, KeumnamAhn, Do YoungShrestha, Nabeen K.Mane, Rajaram S.Lee, Joong KeeHan, Sung-Hwan
Issue Date
2015-09-23
Publisher
WILEY-V C H VERLAG GMBH
Citation
ADVANCED FUNCTIONAL MATERIALS, v.25, no.36, pp.5739 - 5747
Abstract
Nanostructured thin films of metal sulfides (MS) are highly desirable materials for various optoelectronic device applications. However, a general low-temperature protocol that describes deposition of varieties of MS structures, especially in their film form is still not available in literatures. Here, a simple and highly effective general solution-based deposition protocol for highly crystalline and well-defined nanostructured MS thin films from ethanol on variety of conducting and non-conducting substrates is presented. The films display remarkable electronic properties such as high carrier mobility and high conductivity. When NiS thin film deposited on a flexible polyethylene terephthalate (PET) substrate is used as a fluorine doped tin oxide (FTO)-free counter electrode in dye-sensitized solar cells, it exhibits a solar-to-electric power conversion efficiency of 9.27 +/- 0.26% with the highest conversion efficiency as high as 9.50% (vs 8.97 +/- 0.07% exhibited by Pt-electrode). In addition, the NiS film deposited on a Ti-foil has demonstrated an outstanding catalytic activity for the hydrogen and oxygen evolution reactions from water.
Keywords
SENSITIZED SOLAR-CELLS; CHEMICAL BATH DEPOSITION; FREE COUNTER ELECTRODE; ATOMIC LAYER DEPOSITION; REDUCED GRAPHENE OXIDE; ACTIVE EDGE SITES; HIGH-PERFORMANCE; VAPOR-DEPOSITION; NANOROD ARRAYS; CDS; SENSITIZED SOLAR-CELLS; CHEMICAL BATH DEPOSITION; FREE COUNTER ELECTRODE; ATOMIC LAYER DEPOSITION; REDUCED GRAPHENE OXIDE; ACTIVE EDGE SITES; HIGH-PERFORMANCE; VAPOR-DEPOSITION; NANOROD ARRAYS; CDS; general protocols; Hall effect; metal sulfides; Pt-free electrocatalysts; thin films
ISSN
1616-301X
URI
https://pubs.kist.re.kr/handle/201004/124998
DOI
10.1002/adfm.201500964
Appears in Collections:
KIST Article > 2015
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