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dc.contributor.authorJi, Yongsung-
dc.contributor.authorLee, Sang-A-
dc.contributor.authorCha, An-Na-
dc.contributor.authorGoh, Munju-
dc.contributor.authorBae, Sukang-
dc.contributor.authorLee, Sanghyun-
dc.contributor.authorSon, Dong Ick-
dc.contributor.authorKim, Tae-Wook-
dc.date.accessioned2024-01-20T07:33:34Z-
dc.date.available2024-01-20T07:33:34Z-
dc.date.created2021-09-04-
dc.date.issued2015-03-
dc.identifier.issn1566-1199-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/125734-
dc.description.abstractWe investigated the resistive switching characteristics of a polystyrene:ZnO-graphene quantum dots system and its potential application in a one diode-one resistor architecture of an organic memory cell. The log-log I-V plot and the temperature-variable I-V measurements revealed that the switching mechanism in a low-current state is closely related to thermally activated transport. The turn-on process was induced by a space-charge-limited current mechanism resulted from the ZnO-graphene quantum dots acting as charge trap sites, and charge transfer through filamentary path. The memory device with a diode presented a similar to 10(3) I-ON/I-OFF ratio, stable endurance cycles (10(2) cycles) and retention times (10(4) s), and uniform cell-to-cell switching. The one diode-one resistor architecture can effectively reduce cross-talk issue and realize a cross bar array as large as similar to 3 kbit in the readout margin estimation. Furthermore, a specific word was encoded using the standard ASCII character code. (C) 2015 Elsevier B.V. All rights reserved.-
dc.languageEnglish-
dc.publisherELSEVIER-
dc.subjectDEVICES-
dc.subjectFILMS-
dc.subjectOXIDE-
dc.subjectPERFORMANCE-
dc.subjectINTEGRATION-
dc.titleResistive switching characteristics of ZnO-graphene quantum dots and their use as an active component of an organic memory cell with one diode-one resistor architecture-
dc.typeArticle-
dc.identifier.doi10.1016/j.orgel.2015.01.010-
dc.description.journalClass1-
dc.identifier.bibliographicCitationORGANIC ELECTRONICS, v.18, pp.77 - 83-
dc.citation.titleORGANIC ELECTRONICS-
dc.citation.volume18-
dc.citation.startPage77-
dc.citation.endPage83-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000349548400011-
dc.identifier.scopusid2-s2.0-84921696412-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
dc.subject.keywordPlusDEVICES-
dc.subject.keywordPlusFILMS-
dc.subject.keywordPlusOXIDE-
dc.subject.keywordPlusPERFORMANCE-
dc.subject.keywordPlusINTEGRATION-
dc.subject.keywordAuthorNonvolatile memory-
dc.subject.keywordAuthorOrganic resistive memory-
dc.subject.keywordAuthorZnO-Graphene quantum dot-
dc.subject.keywordAuthorOne diode-one resistor architecture-
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KIST Article > 2015
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