Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Jo, Jeong-Wan | - |
dc.contributor.author | Kim, Jaekyun | - |
dc.contributor.author | Kim, Kyung-Tae | - |
dc.contributor.author | Kang, Jin-Gu | - |
dc.contributor.author | Kim, Myung-Gil | - |
dc.contributor.author | Kim, Kwang-Ho | - |
dc.contributor.author | Ko, Hyungduk | - |
dc.contributor.author | Kim, Yong-Hoon | - |
dc.contributor.author | Park, Sung Kyu | - |
dc.date.accessioned | 2024-01-20T07:34:07Z | - |
dc.date.available | 2024-01-20T07:34:07Z | - |
dc.date.created | 2021-09-05 | - |
dc.date.issued | 2015-02-18 | - |
dc.identifier.issn | 0935-9648 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/125757 | - |
dc.description.abstract | Incorporation of Zr into an AlOx matrix generates an intrinsically activated ZAO surface enabling the formation of a stable semiconducting IGZO film and good interfacial properties. Photochemically annealed metal-oxide devices and circuits with the optimized sol-gel ZAO dielectric and IGZO semiconductor layers demonstrate the high performance and electrically/mechanically stable operation of flexible electronics fabricated via a low-temperature solution process. | - |
dc.language | English | - |
dc.publisher | WILEY-V C H VERLAG GMBH | - |
dc.subject | THIN-FILM TRANSISTORS | - |
dc.subject | FIELD-EFFECT TRANSISTORS | - |
dc.subject | LOW-TEMPERATURE FABRICATION | - |
dc.subject | GATE DIELECTRICS | - |
dc.subject | ROOM-TEMPERATURE | - |
dc.subject | PERFORMANCE | - |
dc.subject | SUBSTRATE | - |
dc.subject | CIRCUITS | - |
dc.subject | ROUTE | - |
dc.subject | TFTS | - |
dc.title | Highly Stable and Imperceptible Electronics Utilizing Photoactivated Heterogeneous Sol-Gel Metal-Oxide Dielectrics and Semiconductors | - |
dc.type | Article | - |
dc.identifier.doi | 10.1002/adma.201404296 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | ADVANCED MATERIALS, v.27, no.7, pp.1182 - 1188 | - |
dc.citation.title | ADVANCED MATERIALS | - |
dc.citation.volume | 27 | - |
dc.citation.number | 7 | - |
dc.citation.startPage | 1182 | - |
dc.citation.endPage | 1188 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000350057400004 | - |
dc.identifier.scopusid | 2-s2.0-84923046301 | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Physical | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | THIN-FILM TRANSISTORS | - |
dc.subject.keywordPlus | FIELD-EFFECT TRANSISTORS | - |
dc.subject.keywordPlus | LOW-TEMPERATURE FABRICATION | - |
dc.subject.keywordPlus | GATE DIELECTRICS | - |
dc.subject.keywordPlus | ROOM-TEMPERATURE | - |
dc.subject.keywordPlus | PERFORMANCE | - |
dc.subject.keywordPlus | SUBSTRATE | - |
dc.subject.keywordPlus | CIRCUITS | - |
dc.subject.keywordPlus | ROUTE | - |
dc.subject.keywordPlus | TFTS | - |
dc.subject.keywordAuthor | Deep UV photo-chemical activation | - |
dc.subject.keywordAuthor | Flexible metal oxide gate dielectric | - |
dc.subject.keywordAuthor | Low temperature | - |
dc.subject.keywordAuthor | Rollable metal oxide TFT | - |
dc.subject.keywordAuthor | Solution process | - |
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