Origin of broad band emissions of 3C-silicon carbide nanowire by temperature and time resolved photoluminence study

Authors
Lee, K. M.Hwang, J. Y.Urban, B.Singh, A.Neogi, A.Lee, S. K.Choi, T. Y.
Issue Date
2015-02
Publisher
PERGAMON-ELSEVIER SCIENCE LTD
Citation
SOLID STATE COMMUNICATIONS, v.204, pp.16 - 18
Abstract
As-grown by chemical vapor deposition (CVD) technique, 3C-silicon carbide (3C-SiC) nanowires (NWs) were studied for their energy states by photonic interactions. Temperature dependent photoluminescence (TDPL) was employed in the study. High energy emissions in UV range were found. In order to better understand origins of the high energy emissions, a time resolved photoluminescence (TRPL) study was executed to manifest the nature of these high energy emissions. Observation with high resolution transmission electron microscopy (HRTEM) confirmed the UV emissions were due to the oxide formed on the outer surface of the NWs. (C) 2014 Elsevier Ltd. All rights reserved.
Keywords
SILICON-CARBIDE; POROUS SILICON; SILICON-CARBIDE; POROUS SILICON; 3C-SiC nanowire; High energy emissions from oxide layers; Temperature dependent; photoluminescence; Time-resolved photoluminescence
ISSN
0038-1098
URI
https://pubs.kist.re.kr/handle/201004/125792
DOI
10.1016/j.ssc.2014.11.020
Appears in Collections:
KIST Article > 2015
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