Structural and Optical Properties of the InxGa1-xAs Nanowires Grown on SiO2 via Vapor-Liquid-Solid Method

Abstract

We report the crystal growth of the InxGa1-xAs nanowires (NWs) on SiO2 substrate using metal organic chemical vapor deposition. Au nanoparticles which are disintegrated from thin Au film have been used as a catalyst for the vapor-liquid-solid growth. Electron microscopy characterization is performed to investigate the structural properties of the InxGa1-xAs NW. The InxGa1-xAs NW grown under an optimal condition has a single-crystal wurtzite structure without any misfit dislocation or stacking fault. Strong room temperature photoluminescence peaks are observed from InxGa1-xAs NWs passivated by GaAs. Very low light reflectance is measured at the NW surface in the wavelength range from 250 to 1200 nm. The single crystal InxGa1-xAs NWs are applicable to the various electrical and optical devices.