Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Kim, Areum | - |
dc.contributor.author | Choi, Hee Soo | - |
dc.contributor.author | Lee, Seon Jea | - |
dc.contributor.author | Choi, Eunmi | - |
dc.contributor.author | Cui, Yinhua | - |
dc.contributor.author | Lee, Ukjae | - |
dc.contributor.author | Kim, Soo-Kil | - |
dc.contributor.author | Yoon, Songhun | - |
dc.contributor.author | Son, Hyung Bin | - |
dc.contributor.author | Pyo, Sung Gyu | - |
dc.contributor.author | Yoon, Sung Pil | - |
dc.date.accessioned | 2024-01-20T09:32:18Z | - |
dc.date.available | 2024-01-20T09:32:18Z | - |
dc.date.created | 2021-09-05 | - |
dc.date.issued | 2014-07 | - |
dc.identifier.issn | 0374-4884 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/126656 | - |
dc.description.abstract | We investigated the role of Ni/Cu metallization and the characteristics of selective thin-film deposition on the Indium tin oxide (ITO), ZnO, SiNx and doped Si surfaces of a silicon solarcell electrode. We propose Ni/Cu metallization as an alternative to silver screen-printing. Our method, called the selective electrode formation (SEF) process, utilizes a low-cost, streamlined wet chemical process. Metallization was confirmed to occur on the Si electrode with adhesion through Pd activation. Ni, which hinders Cu diffusion, was then selectively deposited from a NaH2PO2 based nickel solution, and Cu, the main electrode material, was deposited from a HCHObased copper solution. Ni/Cu was deposited on the ZnO, ITO, or SiNx film. The deposition and the heat treatment of Ni and Cu were successfully performed on a substrate consisting of a patterned n(+)-doped wafer with POCl3 by maintaining the same steady process conditions as in process. | - |
dc.language | English | - |
dc.publisher | KOREAN PHYSICAL SOC | - |
dc.subject | NICKEL SILICIDE | - |
dc.subject | CONTACT RESISTANCE | - |
dc.subject | NI/CU CONTACT | - |
dc.subject | METALLIZATION | - |
dc.subject | IMPROVEMENT | - |
dc.subject | SCHEME | - |
dc.subject | LAYERS | - |
dc.title | Selectivities of an all-wet-processed electrode film on ITO, ZnO, SiNx and doped Si for solar cell applications | - |
dc.type | Article | - |
dc.identifier.doi | 10.3938/jkps.65.222 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.65, no.2, pp.222 - 228 | - |
dc.citation.title | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.citation.volume | 65 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | 222 | - |
dc.citation.endPage | 228 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.identifier.kciid | ART001898491 | - |
dc.identifier.wosid | 000340371100015 | - |
dc.identifier.scopusid | 2-s2.0-84905497210 | - |
dc.relation.journalWebOfScienceCategory | Physics, Multidisciplinary | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | NICKEL SILICIDE | - |
dc.subject.keywordPlus | CONTACT RESISTANCE | - |
dc.subject.keywordPlus | NI/CU CONTACT | - |
dc.subject.keywordPlus | METALLIZATION | - |
dc.subject.keywordPlus | IMPROVEMENT | - |
dc.subject.keywordPlus | SCHEME | - |
dc.subject.keywordPlus | LAYERS | - |
dc.subject.keywordAuthor | SiNx | - |
dc.subject.keywordAuthor | ZnO | - |
dc.subject.keywordAuthor | ITO | - |
dc.subject.keywordAuthor | doped Si | - |
dc.subject.keywordAuthor | Electroless plating | - |
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