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dc.contributor.authorKim, Areum-
dc.contributor.authorChoi, Hee Soo-
dc.contributor.authorLee, Seon Jea-
dc.contributor.authorChoi, Eunmi-
dc.contributor.authorCui, Yinhua-
dc.contributor.authorLee, Ukjae-
dc.contributor.authorKim, Soo-Kil-
dc.contributor.authorYoon, Songhun-
dc.contributor.authorSon, Hyung Bin-
dc.contributor.authorPyo, Sung Gyu-
dc.contributor.authorYoon, Sung Pil-
dc.date.accessioned2024-01-20T09:32:18Z-
dc.date.available2024-01-20T09:32:18Z-
dc.date.created2021-09-05-
dc.date.issued2014-07-
dc.identifier.issn0374-4884-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/126656-
dc.description.abstractWe investigated the role of Ni/Cu metallization and the characteristics of selective thin-film deposition on the Indium tin oxide (ITO), ZnO, SiNx and doped Si surfaces of a silicon solarcell electrode. We propose Ni/Cu metallization as an alternative to silver screen-printing. Our method, called the selective electrode formation (SEF) process, utilizes a low-cost, streamlined wet chemical process. Metallization was confirmed to occur on the Si electrode with adhesion through Pd activation. Ni, which hinders Cu diffusion, was then selectively deposited from a NaH2PO2 based nickel solution, and Cu, the main electrode material, was deposited from a HCHObased copper solution. Ni/Cu was deposited on the ZnO, ITO, or SiNx film. The deposition and the heat treatment of Ni and Cu were successfully performed on a substrate consisting of a patterned n(+)-doped wafer with POCl3 by maintaining the same steady process conditions as in process.-
dc.languageEnglish-
dc.publisherKOREAN PHYSICAL SOC-
dc.subjectNICKEL SILICIDE-
dc.subjectCONTACT RESISTANCE-
dc.subjectNI/CU CONTACT-
dc.subjectMETALLIZATION-
dc.subjectIMPROVEMENT-
dc.subjectSCHEME-
dc.subjectLAYERS-
dc.titleSelectivities of an all-wet-processed electrode film on ITO, ZnO, SiNx and doped Si for solar cell applications-
dc.typeArticle-
dc.identifier.doi10.3938/jkps.65.222-
dc.description.journalClass1-
dc.identifier.bibliographicCitationJOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.65, no.2, pp.222 - 228-
dc.citation.titleJOURNAL OF THE KOREAN PHYSICAL SOCIETY-
dc.citation.volume65-
dc.citation.number2-
dc.citation.startPage222-
dc.citation.endPage228-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.identifier.kciidART001898491-
dc.identifier.wosid000340371100015-
dc.identifier.scopusid2-s2.0-84905497210-
dc.relation.journalWebOfScienceCategoryPhysics, Multidisciplinary-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
dc.subject.keywordPlusNICKEL SILICIDE-
dc.subject.keywordPlusCONTACT RESISTANCE-
dc.subject.keywordPlusNI/CU CONTACT-
dc.subject.keywordPlusMETALLIZATION-
dc.subject.keywordPlusIMPROVEMENT-
dc.subject.keywordPlusSCHEME-
dc.subject.keywordPlusLAYERS-
dc.subject.keywordAuthorSiNx-
dc.subject.keywordAuthorZnO-
dc.subject.keywordAuthorITO-
dc.subject.keywordAuthordoped Si-
dc.subject.keywordAuthorElectroless plating-
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KIST Article > 2014
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