Selectivities of an all-wet-processed electrode film on ITO, ZnO, SiNx and doped Si for solar cell applications

Authors
Kim, AreumChoi, Hee SooLee, Seon JeaChoi, EunmiCui, YinhuaLee, UkjaeKim, Soo-KilYoon, SonghunSon, Hyung BinPyo, Sung GyuYoon, Sung Pil
Issue Date
2014-07
Publisher
KOREAN PHYSICAL SOC
Citation
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.65, no.2, pp.222 - 228
Abstract
We investigated the role of Ni/Cu metallization and the characteristics of selective thin-film deposition on the Indium tin oxide (ITO), ZnO, SiNx and doped Si surfaces of a silicon solarcell electrode. We propose Ni/Cu metallization as an alternative to silver screen-printing. Our method, called the selective electrode formation (SEF) process, utilizes a low-cost, streamlined wet chemical process. Metallization was confirmed to occur on the Si electrode with adhesion through Pd activation. Ni, which hinders Cu diffusion, was then selectively deposited from a NaH2PO2 based nickel solution, and Cu, the main electrode material, was deposited from a HCHObased copper solution. Ni/Cu was deposited on the ZnO, ITO, or SiNx film. The deposition and the heat treatment of Ni and Cu were successfully performed on a substrate consisting of a patterned n(+)-doped wafer with POCl3 by maintaining the same steady process conditions as in process.
Keywords
NICKEL SILICIDE; CONTACT RESISTANCE; NI/CU CONTACT; METALLIZATION; IMPROVEMENT; SCHEME; LAYERS; NICKEL SILICIDE; CONTACT RESISTANCE; NI/CU CONTACT; METALLIZATION; IMPROVEMENT; SCHEME; LAYERS; SiNx; ZnO; ITO; doped Si; Electroless plating
ISSN
0374-4884
URI
https://pubs.kist.re.kr/handle/201004/126656
DOI
10.3938/jkps.65.222
Appears in Collections:
KIST Article > 2014
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