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dc.contributor.authorBae, Kiho-
dc.contributor.authorJang, Dong Young-
dc.contributor.authorChoi, Sung Min-
dc.contributor.authorKim, Byung-Kook-
dc.contributor.authorLee, Jong-Ho-
dc.contributor.authorSon, Ji-Won-
dc.contributor.authorShim, Joon Hyung-
dc.date.accessioned2024-01-20T10:31:30Z-
dc.date.available2024-01-20T10:31:30Z-
dc.date.created2021-09-05-
dc.date.issued2014-02-03-
dc.identifier.issn0040-6090-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/127109-
dc.description.abstractYttrium-doped barium zirconate (Y:BaZrO3, BZY) thin films were prepared using pulsed laser deposition (PLD) on MgO substrates at 700 degrees C by varying the ambient oxygen pressure. The microstructure and electrical properties were then investigated using transmission electron microscopy and electrochemical impedance spectroscopy. Dense, well-crystallized BZY films were produced at ambient oxygen pressures (P-amb,P-o2) of <= 6.67 Pa. At P-amb,P- (2)(o) = 13.3 Pa, conical amorphous defects and porous microstructures were observed in the films. The conductivity of PLD BZY prepared at P-amb,P-o2 <= 13.3 Pa was measured to be close to that of reference polycrystalline BZY films, and the grain-boundary properties governed the overall ion conduction, with nano-grains being covered by the space charge depletion zones. At P-amb,P-o2 >= 13.3 Pa, microstructural defects significantly degraded the electrical properties. (C) 2013 Elsevier B.V. All rights reserved.-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE SA-
dc.subjectDOPED BARIUM ZIRCONATE-
dc.subjectOXIDE FUEL-CELLS-
dc.subjectPROTON CONDUCTION-
dc.subjectGRAIN-BOUNDARIES-
dc.subjectTHIN-FILMS-
dc.subjectELECTRICAL-CONDUCTIVITY-
dc.subjectELECTROLYTE-
dc.subjectIMPEDANCE-
dc.subjectMICROSTRUCTURES-
dc.subjectCERAMICS-
dc.titleInfluence of background oxygen pressure on film properties of pulsed laser deposited Y:BaZrO3-
dc.typeArticle-
dc.identifier.doi10.1016/j.tsf.2013.12.006-
dc.description.journalClass1-
dc.identifier.bibliographicCitationTHIN SOLID FILMS, v.552, pp.24 - 31-
dc.citation.titleTHIN SOLID FILMS-
dc.citation.volume552-
dc.citation.startPage24-
dc.citation.endPage31-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000329987300004-
dc.identifier.scopusid2-s2.0-84892825573-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryMaterials Science, Coatings & Films-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
dc.subject.keywordPlusDOPED BARIUM ZIRCONATE-
dc.subject.keywordPlusOXIDE FUEL-CELLS-
dc.subject.keywordPlusPROTON CONDUCTION-
dc.subject.keywordPlusGRAIN-BOUNDARIES-
dc.subject.keywordPlusTHIN-FILMS-
dc.subject.keywordPlusELECTRICAL-CONDUCTIVITY-
dc.subject.keywordPlusELECTROLYTE-
dc.subject.keywordPlusIMPEDANCE-
dc.subject.keywordPlusMICROSTRUCTURES-
dc.subject.keywordPlusCERAMICS-
dc.subject.keywordAuthorProton-conducting ceramics-
dc.subject.keywordAuthorSolid oxide fuel cells-
dc.subject.keywordAuthorPulse-laser deposition-
dc.subject.keywordAuthorYttrium-doped barium zirconate-
dc.subject.keywordAuthorOxygen pressure-
dc.subject.keywordAuthorTransmission electron microscopy-
dc.subject.keywordAuthorElectrochemical impedance spectroscopy-
dc.subject.keywordAuthorGrain-boundary depletion-
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