Full metadata record

DC Field Value Language
dc.contributor.authorJang, Mi-
dc.contributor.authorBaek, Kyung Youl-
dc.contributor.authorYang, Hoichang-
dc.date.accessioned2024-01-20T11:01:15Z-
dc.date.available2024-01-20T11:01:15Z-
dc.date.created2021-09-05-
dc.date.issued2013-12-05-
dc.identifier.issn1932-7447-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/127340-
dc.description.abstractThe temperature-mediated crystal structures of N,N'-ditridecylperylene-3,4,9,10-tetracarboxylic diimide (PTCDI-C13) on organo-compatible polymer/ SiO2 bilayer dielectrics, including either physisorbed or grafted polystyrenes (PSs), were examined and correlated with their electrical characteristics in organic field-effect transistors (OFETs). The crystallinity of the PTCDI-C13 films on these dielectrics increased with increasing annealing temperature (T-A), but the semiconductor-dielectric interfaces were also changed depending on the surface properties of the polymeric dielectrics. When T-A was increased above the glass transition temperature of PSs, the 20-30 nm thick physisorbed PS layers became softened and further dewetted from the oxide surfaces, resulting in the subsidence and disconnection of PTCDI-C13 crystal grains into the undulated PS layers. In contrast, the PS monolayer grafted to the SiO2 surface could maintain a wetting layer even at T-A = 200 degrees C, resulting in a hydroxyl free dielectric surface and highly pi-conjugated structures of T-A-mediated PTCDI-C13 crystals to achieve high-performance OFETs (field-effect mobility up to 0.2 cm(2) V-1 s(-1), threshold voltage similar to 1.0 V, on-off current ratio >10(6), and no gate sweep hysteresis).-
dc.languageEnglish-
dc.publisherAmerican Chemical Society-
dc.subjectFIELD-EFFECT TRANSISTORS-
dc.subjectGLASS-TRANSITION TEMPERATURE-
dc.subjectSOLAR-CELLS-
dc.subjectPERFORMANCE-
dc.subjectFILMS-
dc.subjectELECTRONICS-
dc.subjectSTABILITY-
dc.subjectINVERTERS-
dc.subjectDEVICES-
dc.titleOptimization of Temperature-Mediated Organic Semiconducting Crystals on Soft Polymer-Treated Gate Dielectrics-
dc.typeArticle-
dc.identifier.doi10.1021/jp408097p-
dc.description.journalClass1-
dc.identifier.bibliographicCitationThe Journal of Physical Chemistry C, v.117, no.48, pp.25290 - 25297-
dc.citation.titleThe Journal of Physical Chemistry C-
dc.citation.volume117-
dc.citation.number48-
dc.citation.startPage25290-
dc.citation.endPage25297-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000328101200009-
dc.identifier.scopusid2-s2.0-84890410875-
dc.relation.journalWebOfScienceCategoryChemistry, Physical-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.type.docTypeArticle-
dc.subject.keywordPlusFIELD-EFFECT TRANSISTORS-
dc.subject.keywordPlusGLASS-TRANSITION TEMPERATURE-
dc.subject.keywordPlusSOLAR-CELLS-
dc.subject.keywordPlusPERFORMANCE-
dc.subject.keywordPlusFILMS-
dc.subject.keywordPlusELECTRONICS-
dc.subject.keywordPlusSTABILITY-
dc.subject.keywordPlusINVERTERS-
dc.subject.keywordPlusDEVICES-
Appears in Collections:
KIST Article > 2013
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE