Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Joohwi | - |
dc.contributor.author | Cho, Deok-Yong | - |
dc.contributor.author | Jung, Jisim | - |
dc.contributor.author | Kim, Un Ki | - |
dc.contributor.author | Rha, Sang Ho | - |
dc.contributor.author | Hwang, Cheol Seong | - |
dc.contributor.author | Choi, Jung-Hae | - |
dc.date.accessioned | 2024-01-20T12:03:40Z | - |
dc.date.available | 2024-01-20T12:03:40Z | - |
dc.date.created | 2021-09-05 | - |
dc.date.issued | 2013-06-17 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/127954 | - |
dc.description.abstract | The influence of structural disorder on the electronic structure of amorphous ZnSnO3 was examined by ab-initio calculations. The calculation results are compared with the experimental results using as-deposited and annealed ZnSnO3 films grown by atomic layer deposition. The O K-edge X-ray absorption spectroscopy, X-ray diffraction, and thin-film transistors were employed in the experiment. The conduction band minima of amorphous and crystalline ZnSnO3 mainly consisted of Sn 5s state, while a higher non-uniform localization of these states was observed in the amorphous phase compared with the crystalline counterpart. The experimental results coincide well with the theoretical results. (C) 2013 AIP Publishing LLC. | - |
dc.language | English | - |
dc.publisher | AMER INST PHYSICS | - |
dc.subject | TOTAL-ENERGY CALCULATIONS | - |
dc.subject | OXIDE | - |
dc.subject | TRANSISTORS | - |
dc.subject | STABILITY | - |
dc.title | Theoretical and experimental studies on the electronic structure of crystalline and amorphous ZnSnO3 thin films | - |
dc.type | Article | - |
dc.identifier.doi | 10.1063/1.4811788 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.102, no.24 | - |
dc.citation.title | APPLIED PHYSICS LETTERS | - |
dc.citation.volume | 102 | - |
dc.citation.number | 24 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000320962400052 | - |
dc.identifier.scopusid | 2-s2.0-84879816229 | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | TOTAL-ENERGY CALCULATIONS | - |
dc.subject.keywordPlus | OXIDE | - |
dc.subject.keywordPlus | TRANSISTORS | - |
dc.subject.keywordPlus | STABILITY | - |
dc.subject.keywordAuthor | ZnSnO3 | - |
dc.subject.keywordAuthor | ab-initio calculations | - |
dc.subject.keywordAuthor | O K-edge X-ray | - |
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