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dc.contributor.authorLee, Joohwi-
dc.contributor.authorCho, Deok-Yong-
dc.contributor.authorJung, Jisim-
dc.contributor.authorKim, Un Ki-
dc.contributor.authorRha, Sang Ho-
dc.contributor.authorHwang, Cheol Seong-
dc.contributor.authorChoi, Jung-Hae-
dc.date.accessioned2024-01-20T12:03:40Z-
dc.date.available2024-01-20T12:03:40Z-
dc.date.created2021-09-05-
dc.date.issued2013-06-17-
dc.identifier.issn0003-6951-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/127954-
dc.description.abstractThe influence of structural disorder on the electronic structure of amorphous ZnSnO3 was examined by ab-initio calculations. The calculation results are compared with the experimental results using as-deposited and annealed ZnSnO3 films grown by atomic layer deposition. The O K-edge X-ray absorption spectroscopy, X-ray diffraction, and thin-film transistors were employed in the experiment. The conduction band minima of amorphous and crystalline ZnSnO3 mainly consisted of Sn 5s state, while a higher non-uniform localization of these states was observed in the amorphous phase compared with the crystalline counterpart. The experimental results coincide well with the theoretical results. (C) 2013 AIP Publishing LLC.-
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.subjectTOTAL-ENERGY CALCULATIONS-
dc.subjectOXIDE-
dc.subjectTRANSISTORS-
dc.subjectSTABILITY-
dc.titleTheoretical and experimental studies on the electronic structure of crystalline and amorphous ZnSnO3 thin films-
dc.typeArticle-
dc.identifier.doi10.1063/1.4811788-
dc.description.journalClass1-
dc.identifier.bibliographicCitationAPPLIED PHYSICS LETTERS, v.102, no.24-
dc.citation.titleAPPLIED PHYSICS LETTERS-
dc.citation.volume102-
dc.citation.number24-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000320962400052-
dc.identifier.scopusid2-s2.0-84879816229-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
dc.subject.keywordPlusTOTAL-ENERGY CALCULATIONS-
dc.subject.keywordPlusOXIDE-
dc.subject.keywordPlusTRANSISTORS-
dc.subject.keywordPlusSTABILITY-
dc.subject.keywordAuthorZnSnO3-
dc.subject.keywordAuthorab-initio calculations-
dc.subject.keywordAuthorO K-edge X-ray-
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