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dc.contributor.authorKim, Won Mok-
dc.contributor.authorKim, Jin Soo-
dc.contributor.authorJeong, Jeung-hyun-
dc.contributor.authorPark, Jong-Keuk-
dc.contributor.authorBaik, Young-Jun-
dc.contributor.authorSeong, Tae-Yeon-
dc.date.accessioned2024-01-20T12:34:20Z-
dc.date.available2024-01-20T12:34:20Z-
dc.date.created2021-09-01-
dc.date.issued2013-03-15-
dc.identifier.issn0040-6090-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/128241-
dc.description.abstractPolycrystalline ZnO thin films both undoped and doped with various types of impurities, which covered the wide carrier concentration range of 10(16)-10(21) cm(-3), were prepared by magnetron sputtering, and their optical-band gaps were investigated. The experimentally measured optical band-gap shifts were analyzed by taking into account the carrier density dependent effective mass determined by the first-order nonparabolicity approximation. It was shown that the measured shifts in optical band-gaps in ZnO films doped with cationic dopants, which mainly perturb the conduction band, could be well represented by theoretical estimation in which the band-gap widening due to the band-filling effect and the band-gap renormalization due to the many-body effect derived for a weakly interacting electron-gas model were combined and the carrier density dependent effective mass was incorporated. (C) 2013 Elsevier B. V. All rights reserved.-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE SA-
dc.subjectZINC-OXIDE FILMS-
dc.subjectSTATES EFFECTIVE-MASS-
dc.subjectROOM-TEMPERATURE-
dc.subjectELECTRICAL-PROPERTIES-
dc.subjectSCATTERING PARAMETER-
dc.subjectTRANSPORT PHENOMENA-
dc.subjectINDIUM OXIDE-
dc.subjectTRANSPARENT-
dc.subjectSEMICONDUCTORS-
dc.subjectDEPOSITION-
dc.titleAnalysis of optical band-gap shift in impurity doped ZnO thin films by using nonparabolic conduction band parameters-
dc.typeArticle-
dc.identifier.doi10.1016/j.tsf.2013.01.078-
dc.description.journalClass1-
dc.identifier.bibliographicCitationTHIN SOLID FILMS, v.531, pp.430 - 435-
dc.citation.titleTHIN SOLID FILMS-
dc.citation.volume531-
dc.citation.startPage430-
dc.citation.endPage435-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000316677900066-
dc.identifier.scopusid2-s2.0-84875421406-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryMaterials Science, Coatings & Films-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
dc.subject.keywordPlusZINC-OXIDE FILMS-
dc.subject.keywordPlusSTATES EFFECTIVE-MASS-
dc.subject.keywordPlusROOM-TEMPERATURE-
dc.subject.keywordPlusELECTRICAL-PROPERTIES-
dc.subject.keywordPlusSCATTERING PARAMETER-
dc.subject.keywordPlusTRANSPORT PHENOMENA-
dc.subject.keywordPlusINDIUM OXIDE-
dc.subject.keywordPlusTRANSPARENT-
dc.subject.keywordPlusSEMICONDUCTORS-
dc.subject.keywordPlusDEPOSITION-
dc.subject.keywordAuthorZnO thin film-
dc.subject.keywordAuthorOptical band-gap-
dc.subject.keywordAuthorNonparabolicity-
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