Morphology Control in Block Copolymer Films Using Mixed Solvent Vapors
- Authors
- Gotrik, Kevin W.; Hannon, Adam F.; Son, Jeong Gon; Keller, Brent; Alexander-Katz, Alfredo; Ross, Caroline A.
- Issue Date
- 2012-09
- Publisher
- AMER CHEMICAL SOC
- Citation
- ACS NANO, v.6, no.9, pp.8052 - 8059
- Abstract
- Solvent vapor annealing of block copolymer thin films can produce a range of morphologies different from the equilibrium bulk morphology. By systematically varying the flow rate of two different solvent vapors (toluene and n-heptane) and an inert gas, phase maps showing the morphology versus vapor pressure of the solvents were constructed for 45 kg/mol polystyrene-block-polydimethylsiloxane diblock copolymer films of different thicknesses. The final morphology was correlated with the swelling of the block copolymer and homopolymer films and the solvent vapor annealing conditions. Self-consistent field theory is used to model the effects of solvent swelling. These results provide a framework for predicting the range of morphologies available under different solvent vapor conditions, which is important in lithographic applications where precise control of morphology and critical dimensions are essential.
- Keywords
- THIN-FILMS; ORDERED STRUCTURE; POLYMER-SOLUTIONS; PHASE-BEHAVIOR; THERMODYNAMICS; POLYSTYRENE; TEMPERATURE; CHAIN; THIN-FILMS; ORDERED STRUCTURE; POLYMER-SOLUTIONS; PHASE-BEHAVIOR; THERMODYNAMICS; POLYSTYRENE; TEMPERATURE; CHAIN; self-assembly; solvent vapor annealing; ps-pdms; block copolymer; toluene; heptane; self-consistent field theory
- ISSN
- 1936-0851
- URI
- https://pubs.kist.re.kr/handle/201004/128956
- DOI
- 10.1021/nn302641z
- Appears in Collections:
- KIST Article > 2012
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