Morphology Control in Block Copolymer Films Using Mixed Solvent Vapors

Authors
Gotrik, Kevin W.Hannon, Adam F.Son, Jeong GonKeller, BrentAlexander-Katz, AlfredoRoss, Caroline A.
Issue Date
2012-09
Publisher
AMER CHEMICAL SOC
Citation
ACS NANO, v.6, no.9, pp.8052 - 8059
Abstract
Solvent vapor annealing of block copolymer thin films can produce a range of morphologies different from the equilibrium bulk morphology. By systematically varying the flow rate of two different solvent vapors (toluene and n-heptane) and an inert gas, phase maps showing the morphology versus vapor pressure of the solvents were constructed for 45 kg/mol polystyrene-block-polydimethylsiloxane diblock copolymer films of different thicknesses. The final morphology was correlated with the swelling of the block copolymer and homopolymer films and the solvent vapor annealing conditions. Self-consistent field theory is used to model the effects of solvent swelling. These results provide a framework for predicting the range of morphologies available under different solvent vapor conditions, which is important in lithographic applications where precise control of morphology and critical dimensions are essential.
Keywords
THIN-FILMS; ORDERED STRUCTURE; POLYMER-SOLUTIONS; PHASE-BEHAVIOR; THERMODYNAMICS; POLYSTYRENE; TEMPERATURE; CHAIN; THIN-FILMS; ORDERED STRUCTURE; POLYMER-SOLUTIONS; PHASE-BEHAVIOR; THERMODYNAMICS; POLYSTYRENE; TEMPERATURE; CHAIN; self-assembly; solvent vapor annealing; ps-pdms; block copolymer; toluene; heptane; self-consistent field theory
ISSN
1936-0851
URI
https://pubs.kist.re.kr/handle/201004/128956
DOI
10.1021/nn302641z
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KIST Article > 2012
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