DSpace at KISTKIST Article2012

Full metadata record

DC Field Value Language
dc.contributor.authorKang, Tae Dong-
dc.contributor.authorSim, Kyung Ik-
dc.contributor.authorKim, Jae Hoon-
dc.contributor.authorWu, Zhe-
dc.contributor.authorCheong, Byung-ki-
dc.contributor.authorLee, Hosun-
dc.date.accessioned2024-01-20T14:30:39Z-
dc.date.available2024-01-20T14:30:39Z-
dc.date.created2021-09-05-
dc.date.issued2012-07-31-
dc.identifier.issn0040-6090-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/129048-
dc.description.abstractWe grew Ge-SbTe films on glass substrates using RF sputtering deposition. We measured the dielectric function of the Ge-doped SbTe thin films in the infrared and visible spectral region. By applying linear extrapolation to the absorption coefficient, we obtained accurate band gap energy values, which decreased with increasing Te composition. Using the Drude model, we estimated their resistivity and mean scattering time. Compared to the Hall effect parameters of carrier concentration and mobility, we estimated the effective mass of holes for the Ge-SbTe thin films. (C) 2012 Elsevier B. V. All rights reserved.-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE SA-
dc.subjectOPTICAL-PROPERTIES-
dc.subjectFILMS-
dc.subjectGAP-
dc.titleInfrared spectroscopic ellipsometry of Ge-doped SbTe alloys-
dc.typeArticle-
dc.identifier.doi10.1016/j.tsf.2012.05.030-
dc.description.journalClass1-
dc.identifier.bibliographicCitationTHIN SOLID FILMS, v.520, no.19, pp.6221 - 6225-
dc.citation.titleTHIN SOLID FILMS-
dc.citation.volume520-
dc.citation.number19-
dc.citation.startPage6221-
dc.citation.endPage6225-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000306104900030-
dc.identifier.scopusid2-s2.0-84863575969-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryMaterials Science, Coatings & Films-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
dc.subject.keywordPlusOPTICAL-PROPERTIES-
dc.subject.keywordPlusFILMS-
dc.subject.keywordPlusGAP-
dc.subject.keywordAuthorPhase change random access memory-
dc.subject.keywordAuthorGermanium-
dc.subject.keywordAuthorDoped antimony telluride-
dc.subject.keywordAuthorDielectric function-
dc.subject.keywordAuthorBand gap-
dc.subject.keywordAuthorEffective mass-
dc.subject.keywordAuthorSputtering-
Appears in Collections:
KIST Article > 2012
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML
Show Simple Item Record

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE