Effect of oxidizing the ferromagnetic electrode in magnetic tunnel junctions on tunneling magnetoresistance

Authors
Joo, SungjungJung, K. Y.Lee, B. C.Kim, Tae-SukShin, K. H.Jung, Myung-HwaRho, K-J.Park, J. -H.Hong, JinkiRhie, K.
Issue Date
2012-04-23
Publisher
AMER INST PHYSICS
Citation
APPLIED PHYSICS LETTERS, v.100, no.17
Abstract
The ferromagnetic layer in magnetic tunnel junctions (MTJs) was oxidized with varying O-2 concentrations, and the corresponding effect on spin-dependent transport was studied. As expected from our previous results for MTJs with an over-oxidized AlOx tunnel barrier, a partially oxidized ferromagnetic layer plays an important role in spin-dependent transport. As the temperature is lowered, the junction resistance increases dramatically, and the tunneling magnetoresistance (TMR) is strongly suppressed. Increasing the O-2 concentration enhances the increase of resistance and suppression of TMR. This work supports our previous conclusion that oxidizing the ferromagnetic layer generates localized magnetic moments, which act as a scattering center for spin-polarized tunneling electrons. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4704557]
Keywords
EXCHANGE MODEL; ANOMALIES; STATES; TRANSISTOR; DEPENDENCE; EXCHANGE MODEL; ANOMALIES; STATES; TRANSISTOR; DEPENDENCE
ISSN
0003-6951
URI
https://pubs.kist.re.kr/handle/201004/129325
DOI
10.1063/1.4704557
Appears in Collections:
KIST Article > 2012
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE