Terahertz phase microscopy in the sub-wavelength regime
- Authors
- Yi, Minwoo; Lee, Kanghee; Song, Jin-Dong; Ahn, Jaewook
- Issue Date
- 2012-04-16
- Publisher
- AMER INST PHYSICS
- Citation
- APPLIED PHYSICS LETTERS, v.100, no.16
- Abstract
- Gouy phase shift is a well-known behavior that occurs when a propagating light is focused, but its behavior in the sub-wavelength confinement is not yet known. Here, we report the theoretical and experimental study of the aperture-size dependency of the Gouy phase shift in the sub-wavelength diffraction regime. In experiments carried out with laser-induced terahertz (THz) wave emission from various semiconductor apertures, we demonstrate the use of Guoy phase shit for sub-wavelength THz microscopy. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4705294]
- Keywords
- III-V semiconductors; indium compounds; terahertz wave spectra
- ISSN
- 0003-6951
- URI
- https://pubs.kist.re.kr/handle/201004/129330
- DOI
- 10.1063/1.4705294
- Appears in Collections:
- KIST Article > 2012
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