Terahertz phase microscopy in the sub-wavelength regime

Authors
Yi, MinwooLee, KangheeSong, Jin-DongAhn, Jaewook
Issue Date
2012-04-16
Publisher
AMER INST PHYSICS
Citation
APPLIED PHYSICS LETTERS, v.100, no.16
Abstract
Gouy phase shift is a well-known behavior that occurs when a propagating light is focused, but its behavior in the sub-wavelength confinement is not yet known. Here, we report the theoretical and experimental study of the aperture-size dependency of the Gouy phase shift in the sub-wavelength diffraction regime. In experiments carried out with laser-induced terahertz (THz) wave emission from various semiconductor apertures, we demonstrate the use of Guoy phase shit for sub-wavelength THz microscopy. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4705294]
Keywords
III-V semiconductors; indium compounds; terahertz wave spectra
ISSN
0003-6951
URI
https://pubs.kist.re.kr/handle/201004/129330
DOI
10.1063/1.4705294
Appears in Collections:
KIST Article > 2012
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