Electrical transport characteristics through molecular layers
- Authors
- Wang, Gunuk; Kim, Tae-Wook; Lee, Takhee
- Issue Date
- 2011-12
- Publisher
- ROYAL SOC CHEMISTRY
- Citation
- JOURNAL OF MATERIALS CHEMISTRY, v.21, no.45, pp.18117 - 18136
- Abstract
- In the past few decades, considerable progress has been made in the field of molecular electronics toward our understanding of charge transport processes and the development of experimental methods. This feature article presents a summary of various experimental characterisation platform testbeds for metal-molecule-metal junctions using self-assembled monolayer molecules. Important results from these techniques are highlighted here. A review of the mechanism of electronic transport through molecular layers is presented. Furthermore, the prospects and advanced architectures for the further development of molecular electronics are presented. These opportunities may contribute to the realisation of practical applications for molecular electronic devices.
- Keywords
- SELF-ASSEMBLED MONOLAYERS; NEGATIVE DIFFERENTIAL RESISTANCE; ATOMIC-FORCE MICROSCOPY; METAL JUNCTIONS; ELECTRONIC TRANSPORT; CONTACT RESISTANCE; LENGTH DEPENDENCE; CHARGE-TRANSPORT; LEVEL ALIGNMENT; GOLD ELECTRODES; SELF-ASSEMBLED MONOLAYERS; NEGATIVE DIFFERENTIAL RESISTANCE; ATOMIC-FORCE MICROSCOPY; METAL JUNCTIONS; ELECTRONIC TRANSPORT; CONTACT RESISTANCE; LENGTH DEPENDENCE; CHARGE-TRANSPORT; LEVEL ALIGNMENT; GOLD ELECTRODES
- ISSN
- 0959-9428
- URI
- https://pubs.kist.re.kr/handle/201004/129761
- DOI
- 10.1039/c1jm12702k
- Appears in Collections:
- KIST Article > 2011
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