Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 이연희 | - |
dc.contributor.author | 이지혜 | - |
dc.contributor.author | 임원철 | - |
dc.contributor.author | 신관우 | - |
dc.date.accessioned | 2024-01-20T17:31:35Z | - |
dc.date.available | 2024-01-20T17:31:35Z | - |
dc.date.created | 2022-01-10 | - |
dc.date.issued | 2011-03 | - |
dc.identifier.issn | 1341-1756 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/130550 | - |
dc.title | Investigation of microphase separation of PS-PPrMA diblock copolymer films by Time-of-Flight Secondary Ion Mass Spectrometry | - |
dc.type | Article | - |
dc.description.journalClass | 3 | - |
dc.identifier.bibliographicCitation | Journal of Surface Analysis, v.17, no.3, pp.314 - 318 | - |
dc.citation.title | Journal of Surface Analysis | - |
dc.citation.volume | 17 | - |
dc.citation.number | 3 | - |
dc.citation.startPage | 314 | - |
dc.citation.endPage | 318 | - |
dc.subject.keywordAuthor | diblock copolymer | - |
dc.subject.keywordAuthor | microphase separation | - |
dc.subject.keywordAuthor | depth profiling | - |
dc.subject.keywordAuthor | sims | - |
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