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Investigation of microphase separation of PS-PPrMA diblock copolymer films by Time-of-Flight Secondary Ion Mass Spectrometry

Authors

이연희; 이지혜; 임원철; 신관우

Issue Date

2011-03

Citation

Journal of Surface Analysis, v.17, no.3, pp.314 - 318

Keywords

diblock copolymer; microphase separation; depth profiling; sims

ISSN

1341-1756

URI

https://pubs.kist.re.kr/handle/201004/130550

Appears in Collections:

KIST Article > 2011

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