DSpace at KISTKIST Article2011

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dc.contributor.author임원철-
dc.contributor.author이지혜-
dc.contributor.author이연희-
dc.date.accessioned2024-01-20T17:31:36Z-
dc.date.available2024-01-20T17:31:36Z-
dc.date.created2022-01-10-
dc.date.issued2011-03-
dc.identifier.issn1341-1756-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/130551-
dc.titleCharacterization of Cu(InGa)Se2 (CIGS) Thin Films in Solar Cell Devices by Secondary Ion Mass Spectrometry-
dc.typeArticle-
dc.description.journalClass3-
dc.identifier.bibliographicCitationJournal of Surface Analysis, v.17, no.3, pp.324 - 327-
dc.citation.titleJournal of Surface Analysis-
dc.citation.volume17-
dc.citation.number3-
dc.citation.startPage324-
dc.citation.endPage327-
dc.subject.keywordAuthorCIGS-
dc.subject.keywordAuthorQuantitative analysis-
dc.subject.keywordAuthordepth profiling-
dc.subject.keywordAuthorDynamic SIMS-
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